2025/12/22
Masoud Seidi

Masoud Seidi

Academic rank: Assistant Professor
ORCID:
Education: PhD.
H-Index:
Faculty: Engineering
ScholarId:
E-mail: M.seidi [at] ilam.ac.ir
ScopusId:
Phone:
ResearchGate:

Research

Title
An inclusive parametric study to performance improvement in WEDM process of Pure Titanium using Naive Bayes Classifier
Type
JournalPaper
Keywords
Design of Experiment, Taguchi Design, Box-Behnken Design, Wire-Electrical Discharge Machining, Naive Bayes
Year
2025
Journal Scientific Reports
DOI
Researchers Jay Vora ، Shahil Rathod ، Masoud Seidi ، Saeed Yaghoubi ، Rakesh Chaudhari ، Subraya Krishna Bhat

Abstract

Titanum alloys has exceptional hardness and high toughness, which can cause significant challenges in traditional machining. Wire-electrical discharge machining (WEDM) process offer excellent accuracy, and high precision compared to conventional machines. Design of experimental (DOE) technique provides a systematic way to conduct the experimental runs with least trials by saving time, and cost. Thus, the current work focuses on the modelling of WEDM process at numerous input process environments using Taguchi and BBD-RSM approach. The variable input factors of WEDM process includes pulse-on-time (Ton), pulse current (Ip), and pulse-off-time (Toff) whereas the response measures of material removal rate (MRR), and surface roughness (SR) were taken. The performance and adequacy of Taguchi and BBD-RSM models were assessed by using ANOVA, coefficient of determination (R2), and residual plots. The effect of WEDM factors on performance measures were studied by using main effect plots. Based on Entropy criterion, the weights of MRR and SR response factors were computed to, in turn, 0.52 and 0.48. The practical tests defined in the DOE along with the MRR and SR were considered as inputs to the Naive Bayes (NB) predictive model. The prediction findings indicated the appropriate performance of the NB algorithm. The authors believe that the present study, which compares DOE techniques and their application in predicting process outcomes using Naive Bayes classifier, will be useful for users in different domains and various applications.